Video Feature: Semiconductor Chip Metrology
Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
Lumetrics®, Inc. Research selected for presentation at 2013 OptiFab Conference
Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement ...
Lumetrics, Inc. Partners with Concept Machine Tool, Inc. to Bring Products and Services to Mid-West Markets
NEWS RELEASE
Lumetrics Acquisition: Assets to improve quality control for lenses; to open market for new scientific apps.
Rochester, New York, July 10, 2012 – Lumetrics Inc. announced today that it is acquiring ...