Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
May 31, 2017

Automated Dimensional Measurement of Microfluidic Flow Cells

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of ...
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May 17, 2017

Introducing Discovery Service From Lumetrics

Over the past 15 years Lumetrics has worked closely with many customers to develop custom ...
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April 26, 2017

Overview: Lumetrics Precision Measurement Solutions

Lumetrics offers high precision non-contact thickness measurement, wavefront measurement, ...
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March 30, 2017

Measurement of a Lens Stack

The camera lens stack manufacturing process relies heavily on polished lenses that have ...
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January 18, 2017

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Abstract—The silicon wafer manufacturing process relies heavily on precision polished ...
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January 10, 2017

Lumetrics exhibiting at Photonics West 2017

Photonics West 2017 is just around the corner and Lumetrics will be exhibiting in booth ...
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August 16, 2016

Lumetrics, Inc. launches new Web Store for its Thickness and Wavefront Measurement Equipment

August 15, 2016, Rochester, NY: Lumetrics Inc., the leading manufacturer of precision ...
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June 22, 2016

Custom probe design used in-situ at plastic injection molding facility

A customer approached Lumetrics with a desire to better understand the thickness profile ...
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April 20, 2016

ClearWave Plus: A brand new contact lens measurement solution

The ClearWave™ Plus uses a modified ClearWave in combination with the industry standard ...
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March 29, 2016

Custom Precision Probe with Built-In Reference

The successful implementation of non-contact thickness measurement and precision ...
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