The Lumenarium: The official blog of Lumetrics, Inc.

2022 Semiconductor & Chip Market Outlook

Posted January 25, 2022 by Kristin

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand

The global shortage of silicon wafers continues to plague companies that rely on semiconductors to manufacture their products. Silicon wafer inventories continue to lag significantly behind demand, fueling the ongoing revenue growth of the market. To this point, industry analysts predict that through 2026 the global silicon chip market will reach nearly $120 billion.

filed under: Non contact thickness measurement, interferometry, metrology

Advancing Quality Assurance with White Light Interferometry

Posted January 14, 2022 by Kristin

Non-Contact Measurement Supports Growth in Consumer Electronics Market

The demand for touchscreen technology continues to outstrip supply—this is a trend that shows no sign of waning as 2022 gets underway. Recent market statistics published by Counterpoint show that shipments of cell phones in the U.S. market have grown 27% despite shortages in raw materials including silicon chips which are key components for their production.

filed under: cell phone, Non-Contact Measurement, Non contact thickness measurement, QA/QC, interferometry

Maximize Semiconductor Production With Help from Advanced Interferometry

Posted November 08, 2021 by Kristin

By Dave Compertore, Scientist, Lumetrics®, Inc.

Over the past several years, shortages of semiconductors and the components used to make them, such as raw silicon, have had heavy repercussions for manufacturers of chip-based products in the automotive, high tech, and military market sectors.

The cause of these shortages can be attributed to the trickle-down effect of a silicon wafer shortage which is limiting the production of microprocessor chips—a trend that continues to impact semiconductor manufacturers.

To meet the increasing demand for semiconductors under the current constraints of decreased supply of silicon, which is used to produce wafers—an integral product component—semiconductor manufacturers must be strategic in their approach to fabrication.

filed under: Non contact thickness measurement, interferometry, silicon wafer measurement

Certification of Contact Lenses as Calibration Standards

Posted May 18, 2020 by Kristin

Quality control processes can often lag behind advances in technology. For example, ultrasonic sensors that require daily cleaning and re-calibration are widely utilized despite the existence of more accurate and maintenance-free optical metrology solutions. To bridge this gap, manufacturers adopt cutting-edge technology to certify standards. These standards are used to calibrate or confirm performance of older deployed equipment.

The attached application note provides details of such a process employed by contact lens manufacturers to certify standards for calibration of ultrasonic sensors. Lumetrics has a dedicated laboratory where our proprietary light based measurement technology is used for certifying contact lens standards based on center thickness and sagittal height.

filed under: contact lens measurement system, Non contact thickness measurement

Measuring Thickness Uniformity of an Adhesive Deposited on Top of a Porous Substrate

Posted April 23, 2020 by Kristin

Abstract — We describe a technique for non‐contact thickness measurement that can be applied for samples that do not have smooth reflecting surfaces. An example is an adhesive deposited on top of a foam substrate. We use low‐coherence interferometery to obtain an array (a scan) of single‐point measurements using standard OptiGauge Control Center (OCC) software. We describe the algorithm for data processing to extract the effective thickness data for the adhesive layer.

filed under: Non contact thickness measurement, non contact measurement of intraocular lenses

Non-Contact Measurement of Intraocular Lenses

Posted April 16, 2020 by Kristin

Abstract — We describe an optics‐based technique for non‐contact measurements of the thickness parameters of intraocular lenses (IOLs). The technique is based on time‐domain low‐coherence interferometry (LCI) using a beam of light directed to a point on the measurement surface. We show how this technique can be used to measure the difference in thickness of the opposite haptics, and to measure the center thickness of the IOLs located on a mandrel or suspended in a solution.

filed under: Non contact thickness measurement, non contact measurement of intraocular lenses

Multi-layer Measurement with the Lumetrics OptiGauge II

Posted March 16, 2020 by Kristin

The OptiGauge II is a user-friendly non-contact thickness measurement system for multi-layer materials that delivers reliability and sub-micron accuracy so vital to today’s most advanced industries. The OptiGauge II can be particularly useful in Quality, R&D labs, and production floors because it can improve yields, reduce costs, increase quality, and meet compliance requirements.

Multi-layer Measurement with a Lumetrics OptiGauge II

filed under: multi layer thickness measurement, Non contact thickness measurement, OptiGauge II

Lumetrics, Inc. CEO and CTO at Photonics West

Posted February 18, 2020 by Kristin

The 2020 SPIE Photonics West exhibition and trade show was a huge success- Lumetrics, Inc. CEO and Founder, John Hart and CTO Filipp Ignatovich discuss non contact thickness measurement and Lumetrics' capability to measure multilayer structures and characterize material composition. 


filed under: Non contact thickness measurement, transparent armor

New Application Note and Photonics West 2020 Updates

Posted January 09, 2020 by Kristin

We hope 2020 is off to a great start for everyone- we have an upcoming event and a new application note for you!

New Application Note: In this application note, our engineers provide an overview of the user-friendly software application developed for the purposes of measuring tubing using the OptiGauge II non contact thickness measurement system.

filed under: Non contact thickness measurement, OptiGauge, Photonics West

Windshield Wedge Angle and Curvature Measurement Solution

Posted June 26, 2019 by Kristin
As Automotive Glazing technology advances, such as with heads up displays (HUD), the metrology demands associated with manufacturing automotive windshields become more complex.

filed under: Non contact thickness measurement

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