Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
January 18, 2017

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Abstract—The silicon wafer manufacturing process relies heavily on precision polished ...
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January 10, 2017

Lumetrics exhibiting at Photonics West 2017

Photonics West 2017 is just around the corner and Lumetrics will be exhibiting in booth ...
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October 4, 2016

Data Relay Application by Clark Cianfarini

How Lumetrics developed the Data Relay application to meet the needs of a customer who ...
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June 22, 2016

Custom probe design used in-situ at plastic injection molding facility

A customer approached Lumetrics with a desire to better understand the thickness profile ...
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May 23, 2016

Precision Wedge Angle Measurement by Lumetrics Principal Scientist, Dr. Michael Marcus

A customer approached Lumetrics with a need to determine and certify the precision wedge ...
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March 15, 2016

Successful applications: Custom automated test system

A customer needed a custom automated test system to reduce the inspection time during the ...
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March 10, 2016

Lumetrics, Inc. releases new product, the OptiGauge® LT

The OptiGauge® LT is the newest non-contact thickess measurement system from Lumetrics, ...
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December 30, 2016

Measuring Windshields with Heads up Displays

Lumetrics handheld probe holder with 50mm Probe
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December 15, 2015

Measurement of Bioresorbable Stents

Metal stents have been available since 1988. Through the 1990’s, stents went through ...
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July 27, 2015

New OptiGauge product introduced: OptiGauge II

The OptiGauge II is an ideal non-contact thickness measurement system for companies ...
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