The Lumenarium: The official blog of Lumetrics, Inc.

2022 Semiconductor & Chip Market Outlook

Posted January 25, 2022 by Kristin

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand

The global shortage of silicon wafers continues to plague companies that rely on semiconductors to manufacture their products. Silicon wafer inventories continue to lag significantly behind demand, fueling the ongoing revenue growth of the market. To this point, industry analysts predict that through 2026 the global silicon chip market will reach nearly $120 billion.

filed under: Non contact thickness measurement, interferometry, metrology

Advancing Quality Assurance with White Light Interferometry

Posted January 14, 2022 by Kristin

Non-Contact Measurement Supports Growth in Consumer Electronics Market

The demand for touchscreen technology continues to outstrip supply—this is a trend that shows no sign of waning as 2022 gets underway. Recent market statistics published by Counterpoint show that shipments of cell phones in the U.S. market have grown 27% despite shortages in raw materials including silicon chips which are key components for their production.

filed under: cell phone, Non-Contact Measurement, Non contact thickness measurement, QA/QC, interferometry

Maximize Semiconductor Production With Help from Advanced Interferometry

Posted November 08, 2021 by Kristin

By Dave Compertore, Scientist, Lumetrics®, Inc.

Over the past several years, shortages of semiconductors and the components used to make them, such as raw silicon, have had heavy repercussions for manufacturers of chip-based products in the automotive, high tech, and military market sectors.

The cause of these shortages can be attributed to the trickle-down effect of a silicon wafer shortage which is limiting the production of microprocessor chips—a trend that continues to impact semiconductor manufacturers.

To meet the increasing demand for semiconductors under the current constraints of decreased supply of silicon, which is used to produce wafers—an integral product component—semiconductor manufacturers must be strategic in their approach to fabrication.

filed under: Non contact thickness measurement, interferometry, silicon wafer measurement

Market Outlook for Non-Contact Medical Implant Testing

Posted August 20, 2021 by Kristin

White Light Interferometry Applications Advance Capabilities and Precision

Over the past several years, exciting advancements have been made in the market for non-contact, light-based measurements for medical implants such as balloons and catheters. Emerging from the research and development in this area are more precise, automated, and standardized methods which use white light interferometry technology to overcome the limitations of the conventional micrometer gauge used for these purposes.

The ability to accurately measure the thickness of silicone coatings is key to the implant manufacturing process. Whether dip or spray coating methods are used the OptiGauge II can measure the additive thickness in process without the need for destructive testing.

filed under: medical device measurement, Non-Contact Measurement

Optical Interferometry FAQs: Dr. Mike Marcus Talks Pharmaceutical and Medical Device Testing

Posted July 21, 2021 by Kristin

Dr. Mike Marcus, Lumetrics Senior Scientist works as part of the development team to design and manufacture precision non-contact thickness measurement and optical inspection systems. While at Kodak, he developed the field of low-coherence interferometry for use in product assessment and manufacturing process monitoring and control.

filed under: medical device measurement, Non-Contact Measurement, Opthalmics, 503B testing

Developing 503B Test Standards for Ophthalmic Liquids and Oral Medications

Posted July 08, 2021 by Kristin

The FDA’s designation for 503B outsourcing facilities has opened a fast-growing, high-demand segment in the compounding pharmacy market. There is tremendous potential to improve the purity and sterility of both human and veterinary drugs with the use of cGMP, or current Good Manufacturing Practices. While the FDA regulates adherence to the manufacturers’ quality, training, and control processes, pharmaceutical manufacturers must determine their own testing protocols and test equipment that make up cGMP.

filed under: Non-Contact Measurement, liquid refractive index measurement, 503B testing

Certification of Contact Lenses as Calibration Standards

Posted May 18, 2020 by Kristin

Quality control processes can often lag behind advances in technology. For example, ultrasonic sensors that require daily cleaning and re-calibration are widely utilized despite the existence of more accurate and maintenance-free optical metrology solutions. To bridge this gap, manufacturers adopt cutting-edge technology to certify standards. These standards are used to calibrate or confirm performance of older deployed equipment.

The attached application note provides details of such a process employed by contact lens manufacturers to certify standards for calibration of ultrasonic sensors. Lumetrics has a dedicated laboratory where our proprietary light based measurement technology is used for certifying contact lens standards based on center thickness and sagittal height.

filed under: contact lens measurement system, Non contact thickness measurement

Measuring Thickness Uniformity of an Adhesive Deposited on Top of a Porous Substrate

Posted April 23, 2020 by Kristin

Abstract — We describe a technique for non‐contact thickness measurement that can be applied for samples that do not have smooth reflecting surfaces. An example is an adhesive deposited on top of a foam substrate. We use low‐coherence interferometery to obtain an array (a scan) of single‐point measurements using standard OptiGauge Control Center (OCC) software. We describe the algorithm for data processing to extract the effective thickness data for the adhesive layer.

filed under: Non contact thickness measurement, non contact measurement of intraocular lenses

Non-Contact Measurement of Intraocular Lenses

Posted April 16, 2020 by Kristin

Abstract — We describe an optics‐based technique for non‐contact measurements of the thickness parameters of intraocular lenses (IOLs). The technique is based on time‐domain low‐coherence interferometry (LCI) using a beam of light directed to a point on the measurement surface. We show how this technique can be used to measure the difference in thickness of the opposite haptics, and to measure the center thickness of the IOLs located on a mandrel or suspended in a solution.

filed under: Non contact thickness measurement, non contact measurement of intraocular lenses

Multi-layer Measurement with the Lumetrics OptiGauge II

Posted March 16, 2020 by Kristin

The OptiGauge II is a user-friendly non-contact thickness measurement system for multi-layer materials that delivers reliability and sub-micron accuracy so vital to today’s most advanced industries. The OptiGauge II can be particularly useful in Quality, R&D labs, and production floors because it can improve yields, reduce costs, increase quality, and meet compliance requirements.

Multi-layer Measurement with a Lumetrics OptiGauge II

filed under: multi layer thickness measurement, Non contact thickness measurement, OptiGauge II

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