The Lumenarium: The official blog of Lumetrics, Inc.

Enhanced Wavefront Analysis Software Improves User Experience and Measurement Capabilities

Posted July 11, 2017 by Kristin

Lumetrics, Inc. (Rochester, NY) has developed the next generation of Complete Light Analysis System (CLAS) software within its line of wavefront sensing instruments. The focus has been on several key elements to enhance the existing feature set of the old software. These enhancements have driven the new software, CLAS-NX, towards a simplified single-window interface that is intuitive and easy to use.

filed under: Wavefront Measurement Articles

Lumetrics, Inc. launches new Web Store for its Thickness and Wavefront Measurement Equipment

Posted August 16, 2016 by Kristin

August 15, 2016, Rochester, NY: Lumetrics Inc., the leading manufacturer of precision measurement solution equipment known for offering precision thickness and wavefront measurement instrumentation, is proud to announce the launch of its highly anticipated Web Store. Lumetrics’ Web Store allows customers to easily order probes, fixtures, software, and other accessories in the U.S. (please note that web store shipments are limited to shipments to US State & territories). Lumetrics plans on adding international ordering to the Web Store in the future.

filed under: contact lenses, Lumetrics Inc., Non contact thickness measurement, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences, web store

ClearWave Plus: A brand new contact lens measurement solution

Posted April 20, 2016 by Kristin
The ClearWave™ Plus uses a modified ClearWave in combination with the industry standard OptiGauge®

filed under: center thickness, contact lens, contact lens measurement system, Dimensional Measurement, Non contact thickness measurement, Opthalmic, sagittal height, Wavefront Measurement Articles

Lumetrics Obtains Patent for Wavefront Sensor Contact Lens Measurement System

Posted May 15, 2015 by Kristin

Lumetrics was awarded a patent for an apparatus that measures the optical performance characteristics and dimensions of an optical element using a Shack-Hartmann wavefront sensor and a low coherence interferometer. This is a major improvement on current manufacturing inspection methods, especially for the contact lens and intraocular lens industries. Read More

filed under: contact lens measurement system, Lumetrics, Patent Approval, Wavefront Measurement Articles

Lumetrics Acquisition: Assets to improve quality control for lenses; to open market for new scientific apps.

Posted July 11, 2012 by Kristin

Rochester, New York, July 10, 2012 – Lumetrics Inc. announced today that it is acquiring key assets of the former WaveFront Sciences Company from Abbott.  This business transaction will allow Lumetrics to expand its repertoire of services and grow its business substantially.

filed under: Engineering, Lumetrics, medical device inspection, Non-Contact Measurement, Opthalmic, Optical Interferometry, Optical Measurement, Optics, quality control, Rochester New York, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences

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