The Lumenarium: The official blog of Lumetrics, Inc.

Optical Thickness Measurement of Multilayer Films

Posted September 10, 2018 by Kristin

Abstract — Manufacturers of multi-layer films can realize significant cost savings, product quality improvements, and reduce the risk of product failures by accurately measuring individual layer thicknesses of multi-layer materials instead of relying on gauging that can only provide total thickness. 

filed under: Thickness Measurement, Thin Film Coating, film thickness measurement, optical metrology

The Official Lumetrics, Inc. White Papers!

Posted August 25, 2010 by Kristin

Recently, our technical writers have been creating some white papers that will be featured on our site and available for download.  Good news: they are free!  Just click the sign up form below and you will be able to get regular copies of our white papers when they become available.  If you ever decide that you don't want to receive white papers, you can simply unsubscribe via email.

filed under: Beta Gauge, Engineering, Lumetrics, Lumetrics University, medical device inspection, Non contact thickness measurement, Non-Destructive Measurement, optical interferometry, Optical Interferometry, Optics & Photonics News, Photonics, Thickness Measurement, Thin Film Coating

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