filed under: institute of optics, mary banning friedlander, measure thin films, multi layer coatings, multi layer films, multi layer low reflecting coatings, multi layer thickness measurement, optical coatings, Rochester NY, University of Rochester
On Wednesday, July 22 2015, Representative Louise Slaughter's office announced that Rochester, NY won a very arduous battle to be named the headquarter for the new Integrated Photonics Institute In Manufacturing Innovation (IP-IMI). New York Photonics published a comprehensive article (with links to other relevant articles about the project):
Rochester, NY- July 14, 2011- Lumetrics, Inc., a leading manufacturer of world-class measurement technology, has reached a new milestone. After nearly a year, Lumetrics, Inc. has received trademark approval for their name which was first used in commerce in July of 2003 for “optical devices, namely, fiber-optic measurement instruments, high precision thickness measuring and gauging instruments, film measuring instruments, dimensional measuring instruments, and optical comparator instruments, all for scientific use in class 9(U.S. CLS, 21, 23, 26, 36, and 38)”. Additionally in October of 2005, the Lumetrics’ now trademarked name was used for other optical instruments “for measuring the dimensions of components of the human body for medical use”.
ROCHESTER, N.Y., October 14, 2010 — Lumetrics, a leading manufacturer of world-class precision thickness measurement technology, will showcase its continued development of the Small Business Innovation Research (SBIR) funded Fundus Camera at the Optical Society of America Frontiers in Optics 2010 tradeshow at the Rochester Riverside Convention Center on October 24 to 28.
filed under: 13WHAM, Democrat & Chronicle, Engineering, Frontiers in Optics, Fundus Camera, Inc., Lumetrics, optical interferometry, Optical Interferometry, Optical Society of America, Optics & Photonics News, OptiGauge, Photonics, Rochester NY, Thickness Measurement, WHEC-TV, WROC TV 8, WUHF Fox, YNN Rochester