The Lumenarium: The official blog of Lumetrics, Inc.

Lumetrics®, Inc. Research selected for presentation at 2013 OptiFab Conference

Posted December 05, 2013 by Kristin

Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement
solutions, Lumetrics®, Inc. was selected to present at the
prominent 2013 OptiFab conference and exhibition. Michael Marcus, Lumetrics Principal Scientist and former
Kodak inventor, presented his work on using non‐contact
thickness and distance measurements for quick and precise
measurements of refractive indices of polymers and glass
in air and liquid.  Read More

filed under: contact lens inspection, contact lenses, Dimensional Measurement, Engineering, intraocular lenses, medical device inspection, Opthalmics, optical interferometry, Optical Measurement, optifab 2013, quality control, refractive index, refractive index measurement, Thickness Measurement

Lumetrics, Inc. Partners with Concept Machine Tool, Inc. to Bring Products and Services to Mid-West Markets

Posted August 08, 2012 by Kristin

NEWS RELEASE

filed under: concept machine tool, Lumetrics, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Optical Measurement, OptiGauge, QA/QC, quality control, Thickness Measurement

Lumetrics Acquisition: Assets to improve quality control for lenses; to open market for new scientific apps.

Posted July 11, 2012 by Kristin

Rochester, New York, July 10, 2012 – Lumetrics Inc. announced today that it is acquiring key assets of the former WaveFront Sciences Company from Abbott.  This business transaction will allow Lumetrics to expand its repertoire of services and grow its business substantially.

filed under: Engineering, Lumetrics, medical device inspection, Non-Contact Measurement, Opthalmic, Optical Interferometry, Optical Measurement, Optics, quality control, Rochester New York, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences

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