The Lumenarium: The official blog of Lumetrics, Inc.

Integrated Photonics Institute will be Headquartered in Rochester, NY

Posted July 22, 2015 by Kristin

On Wednesday, July 22 2015, Representative Louise Slaughter's office announced that Rochester, NY won a very arduous battle to be named the headquarter for the new Integrated Photonics Institute In Manufacturing Innovation (IP-IMI).  New York Photonics published a comprehensive article (with links to other relevant articles about the project):

filed under: innovation, Integrated Photonics Institute In Manufacturing In, manufacturing, new york photonics, Optics & Photonics News, Photonics, Photonics, Rochester NY

"Roc" the Year of Light 2015 in Rochester

Posted February 26, 2015 by Kristin

The international year of light is a global initiative to increase awareness and education on the many ways light effects our world.  Rochester, being a huge player in the world of optics, has a great website if you want to get involved in activities surrounding the international year of light.  Check out the site:  Roc the YOL

filed under: international year of light 2015, #iyl2015, new york photonics, Optics, Photonics, Photonics, rochester regional photonics cluster

Lumetrics®, Inc. Presents Research On Spherical Aberration Standards to Optics Community

Posted February 18, 2014 by Kristin

David Compertore, scientist at Rochester-based Lumetrics Inc, presents latest findings on spherical aberration standards to the optics community at the 2013 OptiFab conference.

filed under: Engineering, Lumetrics, Opthalmics, optical interferometry, Optical Interferometry, Optics & Photonics News, Photonics, spherical aberration standards, Thickness Measurement

Lumetrics, Inc. Earns Trademark Approval

Posted July 14, 2011 by Kristin

Rochester, NY- July 14, 2011- Lumetrics, Inc., a leading manufacturer of world-class measurement technology, has reached a new milestone.  After nearly a year, Lumetrics, Inc. has received trademark approval for their name which was first used in commerce in July of 2003 for “optical devices, namely, fiber-optic measurement instruments, high precision thickness measuring and gauging instruments, film measuring instruments, dimensional measuring instruments, and optical comparator instruments, all for scientific use in class 9(U.S. CLS, 21, 23, 26, 36, and 38)”.  Additionally in October of 2005, the Lumetrics’ now trademarked name was used for other optical instruments “for measuring the dimensions of components of the human body for medical use”.

filed under: Lumetrics, Lumetrics Inc., optical interferometry, Photonics, Registered Trademark, Rochester NY, Thickness Measurement, Trademark Approval

Medical Design & Manufacturing West 2011 is Rapidly Approaching!

Posted November 17, 2010 by Kristin

One of the most renown trade shows in the medical device industry - Medical Design and Manufacturing West- is rapidly approaching.  We're very excited here at Lumetrics as this is one of our biggest events that we participate in.  This year, we'll be doing a few different things to highlight some of the ground-breaking technology we've been working so fervently on.

filed under: Engineering, Fundus Camera, Lumetrics, Lumetrics Inc., MD&M West 2011, medical device inspection, optical interferometry, Optics & Photonics News, Photonics, RoLLS, Thickness Measurement

Breaking News: Lumetrics to Showcase Phase I Development of its Fundus Camera at Upcoming Optical Society of America Frontiers in Optics Tradeshow

Posted October 14, 2010 by Kristin

ROCHESTER, N.Y., October 14, 2010 — Lumetrics, a leading manufacturer of world-class precision thickness measurement technology, will showcase its continued development of the Small Business Innovation Research (SBIR) funded Fundus Camera at the Optical Society of America Frontiers in Optics 2010 tradeshow at the Rochester Riverside Convention Center on October 24 to 28.

filed under: 13WHAM, Democrat & Chronicle, Engineering, Frontiers in Optics, Fundus Camera, Inc., Lumetrics, optical interferometry, Optical Interferometry, Optical Society of America, Optics & Photonics News, OptiGauge, Photonics, Rochester NY, Thickness Measurement, WHEC-TV, WROC TV 8, WUHF Fox, YNN Rochester

Upcoming Tradeshow: OSA Frontiers in Optics 2010!

Posted September 21, 2010 by Kristin

Lumetrics, Inc. is pleased to announce our participation in the upcoming Optical Society of America Frontiers in Optics 2010 Trade-show.  This annual event is taking place at the  Rochester Riverside Convention Center in Rochester, NY, USA, October 24-28.  Lumetrics will be located in booth T204, so make sure you stop by to talk to us about some of the very exciting new things we are working on.  Additionally, we will be performing custom sample measurements- so make sure you set up your appointment now.

filed under: Engineering, Frontiers in Optics, Lumetrics, optical interferometry, Optical Interferometry, Optical Measurement, Optical Society of America, Optics, Optics & Photonics News, Photonics, Thickness Measurement

The Official Lumetrics, Inc. White Papers!

Posted August 25, 2010 by Kristin

Recently, our technical writers have been creating some white papers that will be featured on our site and available for download.  Good news: they are free!  Just click the sign up form below and you will be able to get regular copies of our white papers when they become available.  If you ever decide that you don't want to receive white papers, you can simply unsubscribe via email.

filed under: Beta Gauge, Engineering, Lumetrics, Lumetrics University, medical device inspection, Non contact thickness measurement, Non-Destructive Measurement, optical interferometry, Optical Interferometry, Optics & Photonics News, Photonics, Thickness Measurement, Thin Film Coating

Product Watch: Automated X/Y Tissue Scanner

Posted July 28, 2010 by Kristin

Measuring pericardial and other collagenous tissue has always been a challenge for those in the medical field. However, the Automated X/Y Tissue Scanning System is leading the way in mapping three-dimensional thicknesses. With the data derived from this non-contact, non-destructive scanning system, you can create a safer, properly functioning product, improve inspection time, dramatically reduce costs, and ultimately improve customer satisfaction.

When you can easily measure this tissue, the guesswork is taken out of determining where the thickest and thinnest areas of the tissue are. Thickness plays a critical role in functionality of tissue based products. The Tissue Scanning System can be integrated with other components to configure a fully automated system.

The Food and Drug Association (FDA) and the International Organization for Standardization (ISO) hold strict compliance guidelines on all medical products to validate their safety for use in humans. This system will assure quality control and proper functioning in the products being produced.

The Tissue Scanning System is more accurate than the outmoded system of touch-gauge measuring, a manual, labor-intensive system that puts pressure on the naturally uneven, sterile tissue surface being measured, resulting in an inaccurate thickness measurement. 

By contrast, with the rapid, non-contact measurement of the Tissue Scanning System, the irregular surface of the product can be mapped while still maintaining a sterile environment. The tissue can be measured in a saline solution to maintain hydration and consistency, or out of solution to measure the relationship between dehydration rate and thickness.

Data is available instantaneously on the display in numeric graphical form and can be downloaded to a file or exported to an external database for further analysis.

For additional information on this productivity improvement tool, please contact Lumetrics at or Gary German ( at 585-214-2455 x 121 or cell 585-233-3618 or Steve Heveron-Smith ( at 585-214-2455 x 102 or cell 585-734-3394.

Article Written By: LJennings

filed under: Automated X/Y Tissue Scanner, medical device inspection, non-contact, Non contact thickness measurement, Non-Destructive Testing, optical interferometry, Optical Interferometry, Optics & Photonics News, Photonics, Thickness Gauge, Thickness Measurement