The Lumenarium: The official blog of Lumetrics, Inc.

Lumetrics Obtains Patent for Wavefront Sensor Contact Lens Measurement System

Posted May 15, 2015 by Kristin

Lumetrics was awarded a patent for an apparatus that measures the optical performance characteristics and dimensions of an optical element using a Shack-Hartmann wavefront sensor and a low coherence interferometer. This is a major improvement on current manufacturing inspection methods, especially for the contact lens and intraocular lens industries. Read More

filed under: contact lens measurement system, Lumetrics, Patent Approval, Wavefront Measurement Articles

Lumetrics, Inc. Axial Length Patent Approved, Will Advance Patient Care in Ocular Health

Posted March 02, 2011 by Kristin

Rochester, NY- February 23, 2011- Lumetrics, Inc., a leading manufacturer of world-class precision thickness measurement technology has received patent approval for their newest technology for evaluating internal structure of human eye. The United States Patent #7884946 is titled “Apparatus for Measurement of the Axial Length of an eye.”

filed under: Axial Length, Lumetrics, Lumetrics Inc., medical device inspection, Ocular Health, Opthalmics, optical interferometry, Optics & Photonics News, Patent Approval

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