The Lumenarium: The official blog of Lumetrics, Inc.

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Posted January 18, 2017 by Kristin

AbstractThe silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer

filed under: Dimensional Measurement, Lumetrics, Non contact thickness measurement, optical thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement

Custom probe design used in-situ at plastic injection molding facility

Posted June 22, 2016 by Kristin

A customer approached Lumetrics with a desire to better understand the thickness profile during the molding process of manufacturing a plastic bottle. Due to cycling mechanical machinery within a 24-inch window around the pre-form, a standard probe (with standoff maximum of 2 inches) could not be used while the machine was running.

filed under: blow molding manufacturing, Lumetrics, Non contact thickness measurement, Optical Inspection, OptiGauge, packaging inspection, packaging thickness measurement

Successful applications: Custom automated test system

Posted March 15, 2016 by Kristin

A customer needed a custom automated test system to reduce the inspection time during the setup of their production mold tools. At the time they were using a semi-automated system that would take 10-15 minutes to measure all 10 cavities of the mold tool. Lumetrics was asked to reduce the measurement time to 10 seconds or less with the use of our OptiGauge technology as well as add some addition measurement and functional capabilities.

filed under: Lumetrics, Non contact thickness measurement, Opthalmics, OptiGauge, Thickness Measurement

Lumetrics, Inc. releases new product, the OptiGauge® LT

Posted March 10, 2016 by Kristin
The OptiGauge® LT is the newest non-contact thickess measurement system from Lumetrics, Inc.

filed under: Lumetrics, Lumetrics Inc., New Products, non-contact, Non contact thickness measurement, OptiGauge, OptiGauge LT, Thickness Measurement

Online Tubing Thickness Measurement

Posted February 15, 2016 by Kristin

Lumetrics is the leader in online tubing thickness measurement systems for the ophthalmic, glass, and medical device market.  Our engineering team has developed a new fixture that eliminates the problems of line sensitivity that give all online systems trouble.  The new fixturing provides for easy loading and accommodates line changeovers to different size tubing. Water is the enemy of all hydrophilic tubing production, and the OptiGauge provides the crucial inner diameter, outter diameter, and wall thickness readings that customers require.

filed under: Catheter Measurement, medical device inspection, Non-Contact Measurement, Non contact thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement, tubing measurement

Upcoming Event: Photonics West 2016

Posted January 18, 2016 by Kristin

Lumetrics will be exhibiting at Photonics West this February in Booth #3018!  Please stop by and say hello- we have lots of new measurement solutions for your manufacturing process.

filed under: Non contact thickness measurement, optical thickness measurement, Optics, OptiGauge, photonics west 2016, SPIE, Thickness Measurement

Measuring Windshields with Heads up Displays

Posted December 30, 2015 by Kristin
Lumetrics handheld probe holder with 50mm Probe

filed under: glass thickness measurement, heads up display, Lumetrics, multi layer measuremet, Non contact thickness measurement, OptiGauge, Thickness Measurement, windshield glass measurement

Measurement of Bioresorbable Stents

Posted December 15, 2015 by Kristin

Metal stents have been available since 1988.  Through the 1990’s, stents went through numerous iterations, incorporating different metals and coatings.  As the medical products industry moved through the 2000’s, the use of bioresorbable stents became the newest innovation.  And, it is a tremendous innovation.

filed under: innovation, Lumetrics, medical device inspection, non-contact, Non contact thickness measurement, non-destructive, Optical Interferometry, OptiGauge, Thickness Measurement

New OptiGauge product introduced: OptiGauge II

Posted July 27, 2015 by Kristin

The OptiGauge II is an ideal non-contact thickness measurement system for companies looking to move away from traditional contact measurement systems. It is non-destructive and objective, leaving no margin for operator error. It offers customers extraordinary flexibility in a measurement system. This user-friendly system delivers reliability and sub-micron accuracy so vital to today’s most advanced industries. OptiGauge II can be particularly useful in in Quality, R&D labs, and production floors because it can improve yields, reduce costs, increase quality, and meet compliance requirements.  View the press release on our new product announcement!

filed under: Lumetrics, medical device inspection, New Products, Non contact thickness measurement, Optical Interferometry, OptiGauge, OptiGauge II

Upcoming Event: Photonics West 2013 February 5-7 in San Francisco, CA

Posted November 01, 2012 by Kristin

Lumetrics will be exhibiting at the SPIE Photonics West 2013 Trade Show this coming February 5-7.  They will be located in booth #528 and will be talking about our latest products- the newly acquired WaveFront Sciences products as well as the hand-held fundus camera that they recently earned a $1m grant from the NIH to develop.

filed under: Booth #528, Lumetrics, medical device measurement, Non contact thickness measurement, OptiGauge, Photonics West 2013, SPIE, WaveFront Sciences

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