Materials Cross-Section Using a Low-Coherence Interferometer
Abstract — Optical thickness metrology techniques rely on illuminating the sample of ...
Real-time Group Refractive Index Measurement Of Fluids Using Interferometry
Abstract — Maintaining proper chemical composition of fluids is an important control ...
Automated Dimensional Measurement of Microfluidic Flow Cells
Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of ...
Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies
Abstract—The silicon wafer manufacturing process relies heavily on precision polished ...
Upcoming Event: Photonics West 2016
Lumetrics will be exhibiting at Photonics West this February in Booth #3018! Please stop ...