The Lumenarium: The official blog of Lumetrics, Inc.

Custom Precision Probe with Built-In Reference

Posted March 29, 2016 by Kristin

The successful implementation of non-contact thickness measurement and precision measurement solutions for our customers is heavily dependant on our team of hard-working and talented Engineers.  The following application summary is from one of our Opto-Mechanical engineers after working with a customer to design a custom solution for their critical measurement challenges.

filed under: custom metrology solutions, Lumetrics Inc., manufacturing, Non contact thickness measurement, Optical Interferometry, Optical Measurement, precision measurement, thickness measurement applications

Lumetrics®, Inc. Research selected for presentation at 2013 OptiFab Conference

Posted December 05, 2013 by Kristin

Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement
solutions, Lumetrics®, Inc. was selected to present at the
prominent 2013 OptiFab conference and exhibition. Michael Marcus, Lumetrics Principal Scientist and former
Kodak inventor, presented his work on using non‐contact
thickness and distance measurements for quick and precise
measurements of refractive indices of polymers and glass
in air and liquid.  Read More

filed under: contact lens inspection, contact lenses, Dimensional Measurement, Engineering, intraocular lenses, medical device inspection, Opthalmics, optical interferometry, Optical Measurement, optifab 2013, quality control, refractive index, refractive index measurement, Thickness Measurement

Lumetrics, Inc. Partners with Concept Machine Tool, Inc. to Bring Products and Services to Mid-West Markets

Posted August 08, 2012 by Kristin


filed under: concept machine tool, Lumetrics, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Optical Measurement, OptiGauge, QA/QC, quality control, Thickness Measurement

Lumetrics Acquisition: Assets to improve quality control for lenses; to open market for new scientific apps.

Posted July 11, 2012 by Kristin

Rochester, New York, July 10, 2012 – Lumetrics Inc. announced today that it is acquiring key assets of the former WaveFront Sciences Company from Abbott.  This business transaction will allow Lumetrics to expand its repertoire of services and grow its business substantially.

filed under: Engineering, Lumetrics, medical device inspection, Non-Contact Measurement, Opthalmic, Optical Interferometry, Optical Measurement, Optics, quality control, Rochester New York, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences

Lumetrics, Inc. Selected for Prestigious Innovation Briefs Presentation at MD&M West 2011 Trade Show

Posted January 27, 2011 by Kristin

News Release

filed under: innovation, Innovation Briefs, Lumetrics, Lumetrics Inc., LumetriScan(tm), MD&M West 2011, medical device inspection, Optical Measurement, Press Release, Thickness Measurement, Trade Shows

Upcoming Tradeshow: OSA Frontiers in Optics 2010!

Posted September 21, 2010 by Kristin

Lumetrics, Inc. is pleased to announce our participation in the upcoming Optical Society of America Frontiers in Optics 2010 Trade-show.  This annual event is taking place at the  Rochester Riverside Convention Center in Rochester, NY, USA, October 24-28.  Lumetrics will be located in booth T204, so make sure you stop by to talk to us about some of the very exciting new things we are working on.  Additionally, we will be performing custom sample measurements- so make sure you set up your appointment now.

filed under: Engineering, Frontiers in Optics, Lumetrics, optical interferometry, Optical Interferometry, Optical Measurement, Optical Society of America, Optics, Optics & Photonics News, Photonics, Thickness Measurement