The Lumenarium: The official blog of Lumetrics, Inc.

Lumetrics, a spin-off supplying high precision gauging

Posted July 19, 2015 by Kristin

When the products you make have to be of a precise thickness, that's where a company like Lumetrics comes in.

filed under: Democrat & Chronicle, Lumetrics, Lumetrics news, Non contact thickness measurement, optical interferometry, Optics

Glass Thickness Measurement Using White Light Interferometry: Lumetrics® Vice President Steve Heveron-Smith Explains Why Glass Thickness Measurement is Crucial to a Successful Operation

Posted May 13, 2014 by Kristin

Lumetrics was featured in a Glass International publication about how glass thickness measurement is a critical parameter in a successful operation. Vice President Steve Heveron-Smith described how an all fiber-based interferometer, like Lumetrics' OptiGauge™ can work in different glass applications.


Common methods for measuring glass include laser triangulation, spectrometers, digital micrometers, and manual touch gauges of various types. Manual touch gauges have all the issues inherent to manual measurements including variability based on user, longer time to measure, data integrity, and operator error. Automated gauges like spectrometers, and laser triangulation gauges remove the data integrity and time to measure issues, but often result in issues with set-up and usability.


Lumetrics® has developed an all-fiber based interferometer called the OptiGauge™. Traditional white light interferometers use a mechanical rotating flywheel with mirrors to provide the core function of creating interference fringes- what the system measures. The rotating flywheel is used in conjunction with free space optics, which channel a light beam through a series of mirrors and prisms and then out through an optical fiber to the probe and measured surface. These mirrors can be subject to alignment and use issues over time.


Read the full article here.

filed under: Engineering, glass thickness measurement, Non contact thickness measurement, optical interferometry, Thickness Measurement

Lumetrics®, Inc. Presents Research On Spherical Aberration Standards to Optics Community

Posted February 18, 2014 by Kristin

David Compertore, scientist at Rochester-based Lumetrics Inc, presents latest findings on spherical aberration standards to the optics community at the 2013 OptiFab conference.

filed under: Engineering, Lumetrics, Opthalmics, optical interferometry, Optical Interferometry, Optics & Photonics News, Photonics, spherical aberration standards, Thickness Measurement

Lumetrics®, Inc. Research selected for presentation at 2013 OptiFab Conference

Posted December 05, 2013 by Kristin

Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement
solutions, Lumetrics®, Inc. was selected to present at the
prominent 2013 OptiFab conference and exhibition. Michael Marcus, Lumetrics Principal Scientist and former
Kodak inventor, presented his work on using non‐contact
thickness and distance measurements for quick and precise
measurements of refractive indices of polymers and glass
in air and liquid.  Read More

filed under: contact lens inspection, contact lenses, Dimensional Measurement, Engineering, intraocular lenses, medical device inspection, Opthalmics, optical interferometry, Optical Measurement, optifab 2013, quality control, refractive index, refractive index measurement, Thickness Measurement

MD&M West 2014

Posted December 05, 2013 by Kristin

Lumetrics, Inc. will be exhibiting at the MD&M West 2014 trade show and exhibition on February 11th-13th at the Anaheim Convention Center in Anaheim, CA.  Their booth (#2043) is located in the quality section of the show.

filed under: Canon Trade Shows, Engineering, laser beam profiling, Lumetrics, Lumetrics Inc., MD&M West 2014, medical device inspection, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Opthalmics, optical interferometry, QA/QC, Thickness Measurement, wavefront, WaveFront Sciences

Lumetrics, Inc. Earns Trademark Approval

Posted July 14, 2011 by Kristin

Rochester, NY- July 14, 2011- Lumetrics, Inc., a leading manufacturer of world-class measurement technology, has reached a new milestone.  After nearly a year, Lumetrics, Inc. has received trademark approval for their name which was first used in commerce in July of 2003 for “optical devices, namely, fiber-optic measurement instruments, high precision thickness measuring and gauging instruments, film measuring instruments, dimensional measuring instruments, and optical comparator instruments, all for scientific use in class 9(U.S. CLS, 21, 23, 26, 36, and 38)”.  Additionally in October of 2005, the Lumetrics’ now trademarked name was used for other optical instruments “for measuring the dimensions of components of the human body for medical use”.

filed under: Lumetrics, Lumetrics Inc., optical interferometry, Photonics, Registered Trademark, Rochester NY, Thickness Measurement, Trademark Approval

Medical Design and Manufacturing East 2011

Posted April 06, 2011 by Kristin

Each year, the team members of Lumetrics, Inc. participate in the Medical Design and Manufacturing East trade show and conference.  This year's MD&M East event will be held on June 6th-9th 2011 at the Jacob K. Javits Convention Center in New York, NY.

filed under: Canon Trade Shows, Catheter Measurement, Engineering, FDA Compliance, Fundus Camera- RetPen™, Lumetrics, Lumetrics Inc., LumetriScan™, MD&M East 2011, Medical Balloon Measurement, Medical Design and Manufacturing East 2011, medical device inspection, NIST Traceable, Non-Contact Inspection, Opthalmic Device Innovation, Opthalmics, Optical Inspection, optical interferometry, Optics & Photonics News, OptiGauge, QA/QC, RetPen™, Return On Investment, ROI, Thickness Measurement, UBM Canon

Lumetrics, Inc. Axial Length Patent Approved, Will Advance Patient Care in Ocular Health

Posted March 02, 2011 by Kristin

Rochester, NY- February 23, 2011- Lumetrics, Inc., a leading manufacturer of world-class precision thickness measurement technology has received patent approval for their newest technology for evaluating internal structure of human eye. The United States Patent #7884946 is titled “Apparatus for Measurement of the Axial Length of an eye.”

filed under: Axial Length, Lumetrics, Lumetrics Inc., medical device inspection, Ocular Health, Opthalmics, optical interferometry, Optics & Photonics News, Patent Approval

Press Release: Lumetrics to Showcase ATMS II and Leading Edge Eye Measurement System at Upcoming Medical Design & Manufacturing West Tradeshow

Posted November 24, 2010 by Kristin

Lumetrics to Showcase ATMS II and Leading Edge Eye Measurement System at Upcoming Medical Design & Manufacturing West Tradeshow

filed under: ATMS II OptiGauge™, Axial Length, Lumetrics, MD&M West 2011, medical design, medical device inspection, optical interferometry, Optical Interferometry, Optics & Photonics News, OptiGauge, Thickness Measurement

Medical Design & Manufacturing West 2011 is Rapidly Approaching!

Posted November 17, 2010 by Kristin

One of the most renown trade shows in the medical device industry - Medical Design and Manufacturing West- is rapidly approaching.  We're very excited here at Lumetrics as this is one of our biggest events that we participate in.  This year, we'll be doing a few different things to highlight some of the ground-breaking technology we've been working so fervently on.

filed under: Engineering, Fundus Camera, Lumetrics, Lumetrics Inc., MD&M West 2011, medical device inspection, optical interferometry, Optics & Photonics News, Photonics, RoLLS, Thickness Measurement

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