A customer needed a custom automated test system to reduce the inspection time during the setup of their production mold tools. At the time they were using a semi-automated system that would take 10-15 minutes to measure all 10 cavities of the mold tool. Lumetrics was asked to reduce the measurement time to 10 seconds or less with the use of our OptiGauge technology as well as add some addition measurement and functional capabilities.
A new contact lens is being developed by Dr. Eric Tremblay (a designer) from the Swiss Federal Institute of Technology that may help people see that suffer from age-related macular degeneration. The contact lens features an inbuilt telescope. Read more here
David Compertore, scientist at Rochester-based Lumetrics Inc, presents latest findings on spherical aberration standards to the optics community at the 2013 OptiFab conference.
Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement
solutions, Lumetrics®, Inc. was selected to present at the
prominent 2013 OptiFab conference and exhibition. Michael Marcus, Lumetrics Principal Scientist and former
Kodak inventor, presented his work on using non‐contact
thickness and distance measurements for quick and precise
measurements of refractive indices of polymers and glass
in air and liquid. Read More
filed under: contact lens inspection, contact lenses, Dimensional Measurement, Engineering, intraocular lenses, medical device inspection, Opthalmics, optical interferometry, Optical Measurement, optifab 2013, quality control, refractive index, refractive index measurement, Thickness Measurement
Rochester, NY‐ December 4, 2013‐ The leading manufacturer of thickness measurement and non‐
contact measurement solutions, Lumetrics®, Inc. was selected
to present at the prominent 2013 OptiFab conference and
exhibition. David Compertore, Lumetrics scientist,
presented his work on spherical aberration standards
of intraocular lenses. Read More
Lumetrics, Inc. will be exhibiting at the MD&M West 2014 trade show and exhibition on February 11th-13th at the Anaheim Convention Center in Anaheim, CA. Their booth (#2043) is located in the quality section of the show.
filed under: Canon Trade Shows, Engineering, laser beam profiling, Lumetrics, Lumetrics Inc., MD&M West 2014, medical device inspection, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Opthalmics, optical interferometry, QA/QC, Thickness Measurement, wavefront, WaveFront Sciences
Each year, the team members of Lumetrics, Inc. participate in the Medical Design and Manufacturing East trade show and conference. This year's MD&M East event will be held on June 6th-9th 2011 at the Jacob K. Javits Convention Center in New York, NY.
filed under: Canon Trade Shows, Catheter Measurement, Engineering, FDA Compliance, Fundus Camera- RetPen™, Lumetrics, Lumetrics Inc., LumetriScan™, MD&M East 2011, Medical Balloon Measurement, Medical Design and Manufacturing East 2011, medical device inspection, NIST Traceable, Non-Contact Inspection, Opthalmic Device Innovation, Opthalmics, Optical Inspection, optical interferometry, Optics & Photonics News, OptiGauge, QA/QC, RetPen™, Return On Investment, ROI, Thickness Measurement, UBM Canon
Rochester, NY- February 23, 2011- Lumetrics, Inc., a leading manufacturer of world-class precision thickness measurement technology has received patent approval for their newest technology for evaluating internal structure of human eye. The United States Patent #7884946 is titled “Apparatus for Measurement of the Axial Length of an eye.”