The Lumenarium: The official blog of Lumetrics, Inc.

OptiGauge Techniques to Measure Thicknesses Below 12 Microns

Posted October 05, 2017 by Kristin

The OptiGauge II is a highly accurate instrument for non-contact light-based thickness measurements of transparent and translucent materials. The instrument is subject to a low measurement limit of 12 microns (for glass). It means that only layers that are above this limit in thickness can be measured accurately to a precision of 0.1 microns. However, in some instances, it is possible to measure thicknesses that are below this limit. For example, it can be done when thin coatings or adhesives are applied to thicker substrates.

filed under: Non contact thickness measurement

Thickness Measurement of Opaque Materials Using Interferometry

Posted August 17, 2017 by Kristin

Abstract— Lumetrics has developed a fixture that expands precision measurement capabilities of the commercialized low-coherence interferometer, OptiGauge II, to materials that are not translucent to its measurement beam light of 1310nm. The fixture contains two probes oriented towards each other and an optical reference surface. The effects of the temperature on the measurement accuracy are eliminated via a calibration procedure conducted before the measurement.

filed under: Non contact thickness measurement, interferometry, opaque materials thickness measurement

Accurate Bow Measurements in Glass Capillary Tube

Posted August 03, 2017 by Kristin

Abstract — High quality glass tubing production relies on tightly controlled manufacturing processes. With the addition of a Reference Signal Generator (RSG), the OptiGauge II can aid the control of the straightness of the tube by measuring its bow.

filed under: Non contact thickness measurement, tubing measurement

Materials Cross-Section Using a Low-Coherence Interferometer

Posted July 18, 2017 by Kristin
Abstract — Optical thickness metrology techniques rely on illuminating the sample of interest with light and analyzing the reflections. These techniques work best on objects with smooth surfaces: glass lenses, windows, plastic webs, etc. However, measurement capabilities of such instruments deteriorate in situations where the reflected light is affected by imperfect surfaces, due to optical scattering or absorption. This application note describes a method of obtaining thickness information for such imperfect samples using its optical cross-sectional view acquired in a non-destructive way. The method employs the commercially available instrument, OptiGauge II, which is based on time-domain low-coherence interferometry.

filed under: Non contact thickness measurement, optical thickness measurement, optical metrology

Real-time Group Refractive Index Measurement Of Fluids Using Interferometry

Posted June 21, 2017 by Kristin

Abstract — Maintaining proper chemical composition of fluids is an important control parameter for a variety of different production processes. This is especially critical in the medical device manufacturing to maintain high quality standards. One method to monitor fluid composition is to measure its refractive index.

filed under: Non contact thickness measurement, optical thickness measurement, refractive index measurement, interferometry, metrology, liquid refractive index measurement

Automated Dimensional Measurement of Microfluidic Flow Cells

Posted May 31, 2017 by Kristin

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of microfluidic flow cells possible with low-coherence white light interferometry. The OptiGauge II can measure internal channel heights down to 12 microns with 100 nanometer precision quickly and non-destructively. Machine vision-aided inspection stations can quantify other critical dimensions of entire production runs, ensuring higher product quality and that the performance specifications are met.

filed under: Non contact thickness measurement, optical thickness measurement, flow cell, machine vision, interferometry, metrology, microfluidics

Discovery Service From Lumetrics

Posted May 17, 2017 by Kristin

Over the past 15 years Lumetrics has worked closely with many customers to develop custom metrology solutions to meet specific measurement challenges.

filed under: Non contact thickness measurement

Overview: Lumetrics Precision Measurement Solutions

Posted April 26, 2017 by Kristin

Lumetrics offers high precision non-contact thickness measurement, wavefront measurement, and custom engineering services.

filed under: Non contact thickness measurement

Measurement of a Lens Stack

Posted March 30, 2017 by Kristin

The camera lens stack manufacturing process relies heavily on polished lenses that have precise thicknesses and distances between individual lenses.

filed under: multi layer thickness measurement, Non contact thickness measurement, lens measurement

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Posted January 18, 2017 by Kristin

AbstractThe silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer

filed under: Dimensional Measurement, Lumetrics, Non contact thickness measurement, optical thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement

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