The Lumenarium: The official blog of Lumetrics, Inc.

OptiGauge 2000

Posted February 15, 2019 by Kristin

 Lumetrics is pleased to introduce a brand new product to our OptiGauge portfolio: the OptiGauge 2000.  This non-contact thickness measurement system is based on the time-domain low-coherence interferometry. This technology enables absolute thickness measurement of any material, which is transparent or partially transparent to the measurement light. The OG-2000 uses infrared light with the center wavelength of approximately 2 microns. The OG-2000 is designed to measure specialty and rare materials, such as Germanium, Gallium Arsenide, Beryllium, nano-composite optical ceramics and others. Conventional glass and plastic materials can be measured as well. Our patented technology allows for fast real-time measurements, and can be used for on-line process control as well as off-line quality control purposes.

filed under: Non contact thickness measurement

Refractive Index Measurement System for Contact Lens in a Natural Hydrated State

Posted February 01, 2019 by Kristin

A collaboration between Lumetrics and Johnson & Johnson

Accurate refractive index of the contact lenses is one of the most important parameters needed to properly evaluate the lens performance. Measurements of the refractive power and other optical properties of the lenses are typically conducted in solution, and converted to in-air performance. Such an approach is very sensitive to errors in the refractive indices of both the lens and the solution.

filed under: Opthalmic, Non contact thickness measurement, contact lens, contact lens inspection

Glass Slimming Application Note

Posted November 27, 2018 by Kristin

Abstract – LCD and OLED manufacturers can realize improvements in safety, quality, and production when utilizing Lumetrics’ technology to measure and control the glass slimming process. The OptiGauge II ® allows accurate real-time glass thickness monitoring during the acid etching process.

filed under: glass inspection, Non contact thickness measurement

OptiGauge Techniques to Measure Thicknesses Below 12 Microns

Posted October 05, 2017 by Kristin

The OptiGauge II is a highly accurate instrument for non-contact light-based thickness measurements of transparent and translucent materials. The instrument is subject to a low measurement limit of 12 microns (for glass). It means that only layers that are above this limit in thickness can be measured accurately to a precision of 0.1 microns. However, in some instances, it is possible to measure thicknesses that are below this limit. For example, it can be done when thin coatings or adhesives are applied to thicker substrates.

filed under: Non contact thickness measurement

Thickness Measurement of Opaque Materials Using Interferometry

Posted August 17, 2017 by Kristin

Abstract— Lumetrics has developed a fixture that expands precision measurement capabilities of the commercialized low-coherence interferometer, OptiGauge II, to materials that are not translucent to its measurement beam light of 1310nm. The fixture contains two probes oriented towards each other and an optical reference surface. The effects of the temperature on the measurement accuracy are eliminated via a calibration procedure conducted before the measurement.

filed under: Non contact thickness measurement, interferometry, opaque materials thickness measurement

Accurate Bow Measurements in Glass Capillary Tube

Posted August 03, 2017 by Kristin

Abstract — High quality glass tubing production relies on tightly controlled manufacturing processes. With the addition of a Reference Signal Generator (RSG), the OptiGauge II can aid the control of the straightness of the tube by measuring its bow.

filed under: Non contact thickness measurement, tubing measurement

Materials Cross-Section Using a Low-Coherence Interferometer

Posted July 18, 2017 by Kristin
Abstract — Optical thickness metrology techniques rely on illuminating the sample of interest with light and analyzing the reflections. These techniques work best on objects with smooth surfaces: glass lenses, windows, plastic webs, etc. However, measurement capabilities of such instruments deteriorate in situations where the reflected light is affected by imperfect surfaces, due to optical scattering or absorption. This application note describes a method of obtaining thickness information for such imperfect samples using its optical cross-sectional view acquired in a non-destructive way. The method employs the commercially available instrument, OptiGauge II, which is based on time-domain low-coherence interferometry.

filed under: optical thickness measurement, optical metrology, Non contact thickness measurement

Real-time Group Refractive Index Measurement Of Fluids Using Interferometry

Posted June 21, 2017 by Kristin

Abstract — Maintaining proper chemical composition of fluids is an important control parameter for a variety of different production processes. This is especially critical in the medical device manufacturing to maintain high quality standards. One method to monitor fluid composition is to measure its refractive index.

filed under: Non contact thickness measurement, metrology, optical thickness measurement, interferometry, liquid refractive index measurement, refractive index measurement

Automated Dimensional Measurement of Microfluidic Flow Cells

Posted May 31, 2017 by Kristin

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of microfluidic flow cells possible with low-coherence white light interferometry. The OptiGauge II can measure internal channel heights down to 12 microns with 100 nanometer precision quickly and non-destructively. Machine vision-aided inspection stations can quantify other critical dimensions of entire production runs, ensuring higher product quality and that the performance specifications are met.

filed under: Non contact thickness measurement, metrology, optical thickness measurement, microfluidics, flow cell, machine vision, interferometry

Discovery Service From Lumetrics

Posted May 17, 2017 by Kristin

Over the past 15 years Lumetrics has worked closely with many customers to develop custom metrology solutions to meet specific measurement challenges.

filed under: Non contact thickness measurement

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