Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
February 27, 2023

OptiGauge II versus OptiGauge EMS: Features and key differences

Watch "Lab Dave" (Technology Development Scientist at Lumetrics) as he demonstrates the ...
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January 17, 2023

Determining Group Refractive Index utlizing the Lumetrics OptiGauge II and RICS Fixture

The refractive index (RI) of a material is how much light is refracted or reflected when ...
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October 25, 2022

Automated Optical Inspection and Multi Layer Measurement

Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
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August 24, 2022

Multi Layer Stack Measurement using a Robot and OptiGauge II

In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
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March 16, 2020

Multi-layer Measurement with the Lumetrics OptiGauge II

The OptiGauge II is a user-friendly non-contact thickness measurement system for ...
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March 30, 2017

Measurement of Film Stacks

The field of touchscreen technology is undergoing an explosive growth and development. It ...
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March 30, 2017

Measurement of a Lens Stack

The camera lens stack manufacturing process relies heavily on polished lenses that have ...
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February 7, 2017

Online multilayer film system

A customer presented Lumetrics with a 5 layer product constructed of a liner, adhesive, ...
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March 3, 2016

Women in Optics: Mary Banning Friedlander developed multi-layer low reflecting coatings

Rochester, New York is not just the “birthplace” of the thriving optics industry as we ...
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