The Lumenarium: The official blog of Lumetrics, Inc.

Measurement of Film Stacks

Posted March 30, 2017 by Kristin
The field of touchscreen technology is undergoing an explosive growth and development. It is
difficult to imagine a personal life without a smartphone, a tablet, or some other touchscreen device.  Laptops and desktops alike have acquired touchscreen capabilities. With high pace of the consumer electronics market, there is significa
nt pressure on all aspects of touchscreen business, from improvements in technology, to improvements in quality control, to marketing.  Read More

filed under: multi layer thickness measurement, film thickness measurement

Measurement of a Lens Stack

Posted March 30, 2017 by Kristin

The camera lens stack manufacturing process relies heavily on polished lenses that have precise thicknesses and distances between individual lenses.

filed under: multi layer thickness measurement, Non contact thickness measurement, lens measurement

Online multilayer film system

Posted February 07, 2017 by Kristin

A customer presented Lumetrics with a 5 layer product constructed of a liner, adhesive, middle layer, adhesive and a liner.  The product is made in two operations.  The first operation coats the liner with adhesive then adds the middle layer.  The second operation adds adhesive to the middle layer and then adds the final  liner.

The ability to control the adhesive layer was a critical parameter.  The customer needed to know the adhesive thickness when applied in a wet state and again when cured in a dry state.

filed under: multi layer thickness measurement, film thickness measurement

Women in Optics: Mary Banning Friedlander developed multi-layer low reflecting coatings

Posted March 03, 2016 by Kristin

Rochester, New York is not just the “birthplace” of the thriving optics industry as we know it today, it’s also where the inclusion of women in STEM fields got its start. In 1941, Mary Banning Friedlander (FKA Mary Margaret Banning), a Physics Ph. D. from Johns-Hopkins University began her short but wildly successful career in optics and went on to develop multi-layer low reflecting coatings.

filed under: institute of optics, mary banning friedlander, measure thin films, multi layer coatings, multi layer films, multi layer low reflecting coatings, multi layer thickness measurement, optical coatings, Rochester NY, University of Rochester

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