The Lumenarium: The official blog of Lumetrics, Inc.

International Converting Exhibition: Measuring Multi-layer films and coatings

Posted April 25, 2017 by Kristin

Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE (International Converting Exhibition) conference in Orlando Florida April 25-27.   Lumetrics is featuring the OptiGauge II utilized for measuring multi-layer films, (including EVOH layer) and coatings.  Click here to download our white paper on measuring food packaging materials.

filed under: multi layer films, film thickness measurement, food packaging inspection

Women in Optics: Mary Banning Friedlander developed multi-layer low reflecting coatings

Posted March 03, 2016 by Kristin

Rochester, New York is not just the “birthplace” of the thriving optics industry as we know it today, it’s also where the inclusion of women in STEM fields got its start. In 1941, Mary Banning Friedlander (FKA Mary Margaret Banning), a Physics Ph. D. from Johns-Hopkins University began her short but wildly successful career in optics and went on to develop multi-layer low reflecting coatings.

filed under: institute of optics, mary banning friedlander, measure thin films, multi layer coatings, multi layer films, multi layer low reflecting coatings, multi layer thickness measurement, optical coatings, Rochester NY, University of Rochester

Tested Samples: Critical Adhesive Thickness Measurement

Posted May 06, 2014 by Kristin

filed under: adhesive thickness measurement, medical device inspection, multi layer films, Non contact thickness measurement, Optical Interferometry, Thickness Measurement

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