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About
About Us
Our Company
Leadership
Events
Careers
Products
Non Contact Thickness Measurement Systems
OptiGauge MIR
OptiGauge II
OptiGauge 2000
OptiGauge 600
OptiGauge II EMS
STMS
LumetriScan 360
Software
Accessories
Wavefront Measurement Systems
CLAS-NX
CLAS-FX
ClearWave Plus
Software
Accessories
Services
Our Services
Test & Measurement Services
Discovery Service
Custom Metrology
Accessories
Applications
Applications
Mid-Infrared Measurement
Multi Layer Thickness Measurement
Silicon Wafer Measurement
Glass Inspection + Measurement
Automotive Glass
Medical Device Inspection
Ophthalmic Metrology
Resources
Our Resources
Lumetrics Blog
White Papers
Application Notes
Videos
FAQs
Videos
Contact Us
Lumetrics Metrology Blog
Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
April 8, 2011
Lumetrics President, John Hart, Selected for Innovation Briefs
Lumetrics President, John Hart, was once again selected to participate in the prestigious ...
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April 6, 2011
Medical Design and Manufacturing East 2011
Each year, the team members of Lumetrics, Inc. participate in the Medical Design and ...
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