Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
March 25, 2024

Simplify Windshield Inspection with Wedge Angle Measurement Software

Lumetrics' new wedge angle measurement software will simplify the way automotive glass, ...
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September 27, 2023

Sample Measurement Testing

When it comes to measuring thickness, there are a variety of devices available. However, ...
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August 9, 2023

Simplify Microfluidic Flow Cell Measurements with Low Coherence Interferometry

Low coherence interferometry is a powerful tool that has revolutionized the field of ...
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July 20, 2023

Measure Critical Tubing Parameters Easily With Lumetrics' OptiGauge II

Manufacturers of medical tubing need precision metrology equipment to verify products ...
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July 7, 2023

Developments in Multilayer Measurement

Manufacturers of multilayer materials are constantly searching for ways to improve their ...
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June 7, 2023

Revolutionizing Wafer Inspection: Lumetrics' OptiGauge II for Accurate Bonded Silicon Wafer Measurement

Silicon chip manufacturing is a complex process that requires a suite of advanced ...
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June 6, 2022

Multi Layer Video

Optical Metrology Provides Unique Insights into Multi Layer Materials
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March 25, 2022

Video Feature: Semiconductor Chip Metrology

Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
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February 15, 2022

Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement

Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
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January 25, 2022

Semiconductor & Chip Market Outlook

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
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