The Lumenarium: The official blog of Lumetrics, Inc.

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Posted January 18, 2017 by Kristin

AbstractThe silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer

filed under: Dimensional Measurement, Lumetrics, Non contact thickness measurement, optical thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement

Precision Wedge Angle Measurement by Lumetrics Principal Scientist, Dr. Michael Marcus

Posted May 23, 2016 by Kristin

A customer approached Lumetrics with a need to determine  and certify the precision wedge angle measurement of low angle wedges in the range of 0.5 - 3.5° with a high degree of accuracy.   A custom fixture was designed and constructed which included x, y, z  and rotation stages with micrometer precision position feedback as shown in the diagram. 

filed under: Dimensional Measurement, glass thickness measurement, Lumetrics, Non-Contact Measurement, Thickness Measurement

ClearWave Plus: A brand new contact lens measurement solution

Posted April 20, 2016 by Kristin
The ClearWave™ Plus uses a modified ClearWave in combination with the industry standard OptiGauge®

filed under: center thickness, contact lens, contact lens measurement system, Dimensional Measurement, Non contact thickness measurement, Opthalmic, sagittal height, Wavefront Measurement Articles

Tested Samples: Thickness Measurement of Blow Molded Bottles

Posted May 06, 2014 by Kristin

filed under: Dimensional Measurement, Non contact thickness measurement, Optical Interferometry, Thickness Measurement

Thickness Measurement Files: 7 Things We Can Measure

Posted March 19, 2014 by Kristin

1) Absorbable Stents - Read a great article on how a New Standard Focuses on Testing of Absorbable Stents 

filed under: Catheter Measurement, cell phone, Dimensional Measurement, medical device inspection, NIST Traceable, Non-Contact Measurement, Non contact thickness measurement, Optical Interferometry, Thickness Measurement

Lumetrics®, Inc. Research selected for presentation at 2013 OptiFab Conference

Posted December 05, 2013 by Kristin

Rochester, NY‐ November 4, 2013‐ The leading manufacturer of non‐contact measurement
solutions, Lumetrics®, Inc. was selected to present at the
prominent 2013 OptiFab conference and exhibition. Michael Marcus, Lumetrics Principal Scientist and former
Kodak inventor, presented his work on using non‐contact
thickness and distance measurements for quick and precise
measurements of refractive indices of polymers and glass
in air and liquid.  Read More

filed under: contact lens inspection, contact lenses, Dimensional Measurement, Engineering, intraocular lenses, medical device inspection, Opthalmics, optical interferometry, Optical Measurement, optifab 2013, quality control, refractive index, refractive index measurement, Thickness Measurement

Lumetrics, Inc. To Expand, With Move To New Facilities

Posted April 12, 2011 by Kristin

FOR IMMEDIATE RELEASE

filed under: Catheter Measurement, Dimensional Measurement, FDA, Lumetrics, Lumetrics Inc., Lumetrics University, Medical Device, medical device inspection, Optical Interferometry, Optics & Photonics News, Rochester NY, Thickness Measurement

Lumetrics President, John Hart, Selected for Innovation Briefs

Posted April 08, 2011 by Kristin

Lumetrics President, John Hart, was once again selected to participate in the prestigious Innovation Briefs section of the Medical Design and Manufacturing East 2011 Trade Show and Conference.  Hart will be presenting on Lumetrics' advanced catheter measurement system.  Hart's presentation is scheduled for 11:30 am - 11:55 am on Tuesday, June 7, 2011 in the Innovation Briefs Theater #767.

filed under: Catheter Measurement, Compliance, Dimensional Measurement, FDA, innovation, Innovation Briefs, MD&M East 2011, Medical Design and Manufacturing East 2011, medical device inspection, non-contact, non-destructive, Optical Interferometry, Optics & Photonics News, Return On Investment, Thickness Measurement

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