The Lumenarium: The official blog of Lumetrics, Inc.

Lumetrics®, Inc. Presents Research on spherical aberration standards to Optics Community

Posted December 05, 2013 by Kristin

Rochester, NY‐ December 4, 2013‐ The leading manufacturer of thickness measurement and non‐
contact measurement solutions, Lumetrics®, Inc. was selected
to present at the prominent 2013 OptiFab conference and
exhibition.   David Compertore, Lumetrics scientist,
presented his work on spherical aberration standards
of intraocular lenses.  Read More

filed under: cataracts, intraocular lens, intraocular lens manufacturing, Opthalmics, spherical aberration standards, Thickness Measurement

MD&M West 2014

Posted December 05, 2013 by Kristin

Lumetrics, Inc. will be exhibiting at the MD&M West 2014 trade show and exhibition on February 11th-13th at the Anaheim Convention Center in Anaheim, CA.  Their booth (#2043) is located in the quality section of the show.

filed under: Canon Trade Shows, Engineering, laser beam profiling, Lumetrics, Lumetrics Inc., MD&M West 2014, medical device inspection, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Opthalmics, optical interferometry, QA/QC, Thickness Measurement, wavefront, WaveFront Sciences

Upcoming Event: MD&M East 2013

Posted April 18, 2013 by Kristin

Lumetrics will be exhibiting at MD&M East 2013 on June 18-20 in booth #2548.  Sample measurements using your custom samples will be available.  To set up an appointment please contact us at

filed under: Non contact thickness measurement

Upcoming Event: Photonics West 2013 February 5-7 in San Francisco, CA

Posted November 01, 2012 by Kristin

Lumetrics will be exhibiting at the SPIE Photonics West 2013 Trade Show this coming February 5-7.  They will be located in booth #528 and will be talking about our latest products- the newly acquired WaveFront Sciences products as well as the hand-held fundus camera that they recently earned a $1m grant from the NIH to develop.

filed under: Booth #528, Lumetrics, medical device measurement, Non contact thickness measurement, OptiGauge, Photonics West 2013, SPIE, WaveFront Sciences

Lumetrics, Inc. Partners with Concept Machine Tool, Inc. to Bring Products and Services to Mid-West Markets

Posted August 08, 2012 by Kristin


filed under: concept machine tool, Lumetrics, medical device measurement, Non-Contact Measurement, Non contact thickness measurement, Optical Measurement, OptiGauge, QA/QC, quality control, Thickness Measurement

Lumetrics Acquisition: Assets to improve quality control for lenses; to open market for new scientific apps.

Posted July 11, 2012 by Kristin

Rochester, New York, July 10, 2012 – Lumetrics Inc. announced today that it is acquiring key assets of the former WaveFront Sciences Company from Abbott.  This business transaction will allow Lumetrics to expand its repertoire of services and grow its business substantially.

filed under: Engineering, Lumetrics, medical device inspection, Non-Contact Measurement, Opthalmic, Optical Interferometry, Optical Measurement, Optics, quality control, Rochester New York, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences

Bioabsorbable Stents

Posted June 07, 2012 by Kristin

The article-  “Now you see me, now you don't: The bioabsorbable stent in clinical practice”  by Michael Riordan is extremely interesting in its differing  opinions from the consulting physicians.  I would be interested in knowing how people feel the data has changed these views since the 18 months that the article was written.  I am sure that the “jury is still out” but what have you heard?  Please read the article below and then give us your opinion in the comments!

filed under: Non contact thickness measurement

Balloon Cone Wall Thickness

Posted June 07, 2012 by Kristin

Balloon Cone Wall Thickness

filed under: Non contact thickness measurement

Lumetrics Successes at MD&M East 2012

Posted June 07, 2012 by Kristin

Lumetrics®  exhibited at the 2012 Medical Design and Manufacturing Trade Show last week and it was a huge success.  The last three years have seen a significant reduction in the ability of many companies to provide measurement solutions for their process and quality problems.  Fortunately, Lumetrics® has stepped in to fill that need.

filed under: Non contact thickness measurement

Lumetrics, Inc. Earns Trademark Approval

Posted July 14, 2011 by Kristin

Rochester, NY- July 14, 2011- Lumetrics, Inc., a leading manufacturer of world-class measurement technology, has reached a new milestone.  After nearly a year, Lumetrics, Inc. has received trademark approval for their name which was first used in commerce in July of 2003 for “optical devices, namely, fiber-optic measurement instruments, high precision thickness measuring and gauging instruments, film measuring instruments, dimensional measuring instruments, and optical comparator instruments, all for scientific use in class 9(U.S. CLS, 21, 23, 26, 36, and 38)”.  Additionally in October of 2005, the Lumetrics’ now trademarked name was used for other optical instruments “for measuring the dimensions of components of the human body for medical use”.

filed under: Lumetrics, Lumetrics Inc., optical interferometry, Photonics, Registered Trademark, Rochester NY, Thickness Measurement, Trademark Approval