filed under: institute of optics, mary banning friedlander, measure thin films, multi layer coatings, multi layer films, multi layer low reflecting coatings, multi layer thickness measurement, optical coatings, Rochester NY, University of Rochester
Women in Optics: Mary Banning Friedlander developed multi-layer low reflecting coatings
Online Tubing Thickness Measurement
Lumetrics is the leader in online tubing thickness measurement systems for the ophthalmic, glass, and medical device market. Our engineering team has developed a new fixture that eliminates the problems of line sensitivity that give all online systems trouble. The new fixturing provides for easy loading and accommodates line changeovers to different size tubing. Water is the enemy of all hydrophilic tubing production, and the OptiGauge provides the crucial inner diameter, outter diameter, and wall thickness readings that customers require.
filed under: Catheter Measurement, medical device inspection, Non-Contact Measurement, Non contact thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement, tubing measurement
Upcoming Event: Photonics West 2016
Lumetrics will be exhibiting at Photonics West this February in Booth #3018! Please stop by and say hello- we have lots of new measurement solutions for your manufacturing process.
filed under: Non contact thickness measurement, optical thickness measurement, Optics, OptiGauge, photonics west 2016, SPIE, Thickness Measurement
Measuring Windshields with Heads up Displays
Measurement of Bioresorbable Stents
Metal stents have been available since 1988. Through the 1990’s, stents went through numerous iterations, incorporating different metals and coatings. As the medical products industry moved through the 2000’s, the use of bioresorbable stents became the newest innovation. And, it is a tremendous innovation.
filed under: innovation, Lumetrics, medical device inspection, non-contact, Non contact thickness measurement, non-destructive, Optical Interferometry, OptiGauge, Thickness Measurement
New OptiGauge product introduced: OptiGauge II
The OptiGauge II is an ideal non-contact thickness measurement system for companies looking to move away from traditional contact measurement systems. It is non-destructive and objective, leaving no margin for operator error. It offers customers extraordinary flexibility in a measurement system. This user-friendly system delivers reliability and sub-micron accuracy so vital to today’s most advanced industries. OptiGauge II can be particularly useful in in Quality, R&D labs, and production floors because it can improve yields, reduce costs, increase quality, and meet compliance requirements. View the press release on our new product announcement!
filed under: Lumetrics, medical device inspection, New Products, Non contact thickness measurement, Optical Interferometry, OptiGauge, OptiGauge II
Integrated Photonics Institute will be Headquartered in Rochester, NY
On Wednesday, July 22 2015, Representative Louise Slaughter's office announced that Rochester, NY won a very arduous battle to be named the headquarter for the new Integrated Photonics Institute In Manufacturing Innovation (IP-IMI). New York Photonics published a comprehensive article (with links to other relevant articles about the project):
filed under: innovation, Integrated Photonics Institute In Manufacturing In, manufacturing, new york photonics, Optics & Photonics News, Photonics, Photonics, Rochester NY
Rochester celebrates the International Year of Light
New York Photonics blog posted a great article on the events in Rochester surrounding the International Year of Light celebration- here's a brief overview and link to the full article written by Tom Battley.
filed under: international year of light 2015, #IYOL2015, Optics & Photonics News, Rochester New York
Lumetrics, a spin-off supplying high precision gauging
When the products you make have to be of a precise thickness, that's where a company like Lumetrics comes in.
filed under: Democrat & Chronicle, Lumetrics, Lumetrics news, Non contact thickness measurement, optical interferometry, Optics
Lumetrics Obtains Patent for Wavefront Sensor Contact Lens Measurement System
Lumetrics was awarded a patent for an apparatus that measures the optical performance characteristics and dimensions of an optical element using a Shack-Hartmann wavefront sensor and a low coherence interferometer. This is a major improvement on current manufacturing inspection methods, especially for the contact lens and intraocular lens industries. Read More
filed under: contact lens measurement system, Lumetrics, Patent Approval, Wavefront Measurement Articles