The Lumenarium: The official blog of Lumetrics, Inc.

Thickness Measurement of Opaque Materials Using Interferometry

Posted August 17, 2017 by Kristin

Abstract— Lumetrics has developed a fixture that expands precision measurement capabilities of the commercialized low-coherence interferometer, OptiGauge II, to materials that are not translucent to its measurement beam light of 1310nm. The fixture contains two probes oriented towards each other and an optical reference surface. The effects of the temperature on the measurement accuracy are eliminated via a calibration procedure conducted before the measurement.

filed under: Non contact thickness measurement, interferometry, opaque materials thickness measurement

Accurate Bow Measurements in Glass Capillary Tube

Posted August 03, 2017 by Kristin

Abstract — High quality glass tubing production relies on tightly controlled manufacturing processes. With the addition of a Reference Signal Generator (RSG), the OptiGauge II can aid the control of the straightness of the tube by measuring its bow.

filed under: Non contact thickness measurement, tubing measurement

Materials Cross-Section Using a Low-Coherence Interferometer

Posted July 18, 2017 by Kristin
Abstract — Optical thickness metrology techniques rely on illuminating the sample of interest with light and analyzing the reflections. These techniques work best on objects with smooth surfaces: glass lenses, windows, plastic webs, etc. However, measurement capabilities of such instruments deteriorate in situations where the reflected light is affected by imperfect surfaces, due to optical scattering or absorption. This application note describes a method of obtaining thickness information for such imperfect samples using its optical cross-sectional view acquired in a non-destructive way. The method employs the commercially available instrument, OptiGauge II, which is based on time-domain low-coherence interferometry.

filed under: Non contact thickness measurement, optical thickness measurement, optical metrology

Enhanced Wavefront Analysis Software Improves User Experience and Measurement Capabilities

Posted July 11, 2017 by Kristin

Lumetrics, Inc. (Rochester, NY) has developed the next generation of Complete Light Analysis System (CLAS) software within its line of wavefront sensing instruments. The focus has been on several key elements to enhance the existing feature set of the old software. These enhancements have driven the new software, CLAS-NX, towards a simplified single-window interface that is intuitive and easy to use.

filed under: Wavefront Measurement Articles

Real-time Group Refractive Index Measurement Of Fluids Using Interferometry

Posted June 21, 2017 by Kristin

Abstract — Maintaining proper chemical composition of fluids is an important control parameter for a variety of different production processes. This is especially critical in the medical device manufacturing to maintain high quality standards. One method to monitor fluid composition is to measure its refractive index.

filed under: Non contact thickness measurement, optical thickness measurement, refractive index measurement, interferometry, metrology, liquid refractive index measurement

Automated Dimensional Measurement of Microfluidic Flow Cells

Posted May 31, 2017 by Kristin

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of microfluidic flow cells possible with low-coherence white light interferometry. The OptiGauge II can measure internal channel heights down to 12 microns with 100 nanometer precision quickly and non-destructively. Machine vision-aided inspection stations can quantify other critical dimensions of entire production runs, ensuring higher product quality and that the performance specifications are met.

filed under: Non contact thickness measurement, optical thickness measurement, flow cell, machine vision, interferometry, metrology, microfluidics

Discovery Service From Lumetrics

Posted May 17, 2017 by Kristin

Over the past 15 years Lumetrics has worked closely with many customers to develop custom metrology solutions to meet specific measurement challenges.

filed under: Non contact thickness measurement

Wavefront API Software Application Note

Posted May 04, 2017 by Kristin

Lumetrics has offered various solutions utilizing the Shack-Hartmann wavefront sensor for years further building upon its portfolio with new offerings in the metrology field.

filed under: wavefront measurement,

Overview: Lumetrics Precision Measurement Solutions

Posted April 26, 2017 by Kristin

Lumetrics offers high precision non-contact thickness measurement, wavefront measurement, and custom engineering services.

filed under: Non contact thickness measurement

International Converting Exhibition: Measuring Multi-layer films and coatings

Posted April 25, 2017 by Kristin

Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE (International Converting Exhibition) conference in Orlando Florida April 25-27.   Lumetrics is featuring the OptiGauge II utilized for measuring multi-layer films, (including EVOH layer) and coatings.  Click here to download our white paper on measuring food packaging materials.

filed under: multi layer films, film thickness measurement, food packaging inspection