Lumetrics, Inc. (Rochester, NY) has developed the next generation of Complete Light Analysis System (CLAS) software within its line of wavefront sensing instruments. The focus has been on several key elements to enhance the existing feature set of the old software. These enhancements have driven the new software, CLAS-NX, towards a simplified single-window interface that is intuitive and easy to use.
filed under: Wavefront Measurement Articles
Abstract — Maintaining proper chemical composition of fluids is an important control parameter for a variety of different production processes. This is especially critical in the medical device manufacturing to maintain high quality standards. One method to monitor fluid composition is to measure its refractive index.
filed under: Non contact thickness measurement, optical thickness measurement, refractive index measurement, interferometry, metrology, liquid refractive index measurement
Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of microfluidic flow cells possible with low-coherence white light interferometry. The OptiGauge II can measure internal channel heights down to 12 microns with 100 nanometer precision quickly and non-destructively. Machine vision-aided inspection stations can quantify other critical dimensions of entire production runs, ensuring higher product quality and that the performance specifications are met.
filed under: Non contact thickness measurement, optical thickness measurement, flow cell, machine vision, interferometry, metrology, microfluidics
Over the past 15 years Lumetrics has worked closely with many customers to develop custom metrology solutions to meet specific measurement challenges.
filed under: Non contact thickness measurement
Lumetrics has offered various solutions utilizing the Shack-Hartmann wavefront sensor for years further building upon its portfolio with new offerings in the metrology field.
filed under: wavefront measurement,
Lumetrics offers high precision non-contact thickness measurement, wavefront measurement, and custom engineering services.
filed under: Non contact thickness measurement
Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE (International Converting Exhibition) conference in Orlando Florida April 25-27. Lumetrics is featuring the OptiGauge II utilized for measuring multi-layer films, (including EVOH layer) and coatings. Click here to download our white paper on measuring food packaging materials.
filed under: multi layer films, film thickness measurement, food packaging inspection
An interesting article from the most recent issue of Optics and Photonics News discusses ophthalmic prosthetic devices to help those who suffer from diseases that cause loss of eyesight:
filed under: multi layer thickness measurement, film thickness measurement
The camera lens stack manufacturing process relies heavily on polished lenses that have precise thicknesses and distances between individual lenses.
filed under: multi layer thickness measurement, Non contact thickness measurement, lens measurement
