The camera lens stack manufacturing process relies heavily on polished lenses that have precise thicknesses and distances between individual lenses.
A Shack-Hartmann wave-front sensor system has been used to measure a set of plano-convex lenses at two different times, separated by almost 2 years. The plano-convex lenses were selected to cover a range of powers and apertures relevant to intraocular lenses, and were measured at two different orientations. The results demonstrate the high temporal stability of the measurement system, as well as of the glass standard.
filed under: Thickness Measurement
Medical device manufacturers often struggle when inspecting balloons, tubes, stents, and other medical products with many simplistic measurement devices in use today. There are limitations when using micrometers, microscopes, pin gauges, and razor blades that limit accuracy, repeatability, and general ease-of-use.
A customer presented Lumetrics with a 5 layer product constructed of a liner, adhesive, middle layer, adhesive and a liner. The product is made in two operations. The first operation coats the liner with adhesive then adds the middle layer. The second operation adds adhesive to the middle layer and then adds the final liner.
The ability to control the adhesive layer was a critical parameter. The customer needed to know the adhesive thickness when applied in a wet state and again when cured in a dry state.
A customer approached Lumetrics with a need to measure float glass with a physical thickness of up to 25mm (38mm optical). The standard OptiGauge II is capable of a maximum of approximately 20mm optical thickness. The customer also required a probe with a standoff distance of 150mm while retaining good angular tolerances.
filed under: glass thickness measurement
filed under: Non-Contact Measurement
Abstract—The silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer
Photonics West 2017 is just around the corner and Lumetrics will be exhibiting in booth #616 from January 31st through February 2nd at the Moscone Center in San Francisco, CA. Lumetrics will be showcasing the OptiGauge® II as well as a live demonstration with the CLAS-IR adaptive optics, operating at telecom wavelengths.
August 15, 2016, Rochester, NY: Lumetrics Inc., the leading manufacturer of precision measurement solution equipment known for offering precision thickness and wavefront measurement instrumentation, is proud to announce the launch of its highly anticipated Web Store. Lumetrics’ Web Store allows customers to easily order probes, fixtures, software, and other accessories in the U.S. (please note that web store shipments are limited to shipments to US State & territories). Lumetrics plans on adding international ordering to the Web Store in the future.