The Lumenarium: The official blog of Lumetrics, Inc.

Optical Thickness Measurement of Multilayer Films

Posted September 10, 2018 by Kristin

Abstract — Manufacturers of multi-layer films can realize significant cost savings, product quality improvements, and reduce the risk of product failures by accurately measuring individual layer thicknesses of multi-layer materials instead of relying on gauging that can only provide total thickness. 

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Tags: Thickness Measurement, Thin Film Coating, film thickness measurement, optical metrology