The Lumenarium: The official blog of Lumetrics, Inc.

Kristin

Recent Posts

Optical Thickness Measurement of Coronary Balloons and Medical Tubing

Posted February 15, 2017 by Kristin

Medical device manufacturers often struggle when inspecting balloons, tubes, stents, and other medical products with many simplistic measurement devices in use today. There are limitations when using micrometers, microscopes, pin gauges, and razor blades that limit accuracy, repeatability, and general ease-of-use.

filed under: medical balloons, Thickness Measurement

Online multilayer film system

Posted February 07, 2017 by Kristin

A customer presented Lumetrics with a 5 layer product constructed of a liner, adhesive, middle layer, adhesive and a liner.  The product is made in two operations.  The first operation coats the liner with adhesive then adds the middle layer.  The second operation adds adhesive to the middle layer and then adds the final  liner.

The ability to control the adhesive layer was a critical parameter.  The customer needed to know the adhesive thickness when applied in a wet state and again when cured in a dry state.

filed under: multi layer thickness measurement, film thickness measurement

Extended Measurement Range System for the Measurement of Thick Glass

Posted February 01, 2017 by Kristin

A customer approached Lumetrics with a need to measure float glass with a physical thickness of up to 25mm (38mm optical). The standard OptiGauge II is capable of a maximum of approximately 20mm optical thickness. The customer also required a probe with a standoff distance of 150mm while retaining good angular tolerances.

filed under: glass thickness measurement

Lumetrics Granted New Patent: Toric Intraocular Lens Measurement Apparatus and Method

Posted January 26, 2017 by Kristin
This latest Lumetrics patent is for a device to physically rotate an intraocular lens inside the confined space afforded in a measurement cuvette.  There are times when rotating the data gathered using software is insufficient and the sample must physically be rotated.  This device maintains the alignment of  intraocular lens optical axis with that of the measurement device with which it is paired.  During the rotation the need for realignment is reduced or eliminated.  Read more about this new patent here.

filed under: Non-Contact Measurement

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Posted January 18, 2017 by Kristin

AbstractThe silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer

filed under: Dimensional Measurement, Lumetrics, Non contact thickness measurement, optical thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement

Lumetrics exhibiting at Photonics West 2017

Posted January 10, 2017 by Kristin

Photonics West 2017 is just around the corner and Lumetrics will be exhibiting in booth #616 from January 31st through February 2nd at the Moscone Center in San Francisco, CA. Lumetrics will be showcasing the OptiGauge® II as well as a live demonstration with the CLAS-IR adaptive optics, operating at telecom wavelengths.

filed under: Lumetrics, Non contact thickness measurement, Photonics

Data Relay Application by Clark Cianfarini

Posted October 04, 2016 by Kristin

How Lumetrics developed the Data Relay application to meet the needs of a customer who needed to use a non-windows based system.

filed under: Lumetrics, Thickness Measurement

Lumetrics, Inc. launches new Web Store for its Thickness and Wavefront Measurement Equipment

Posted August 16, 2016 by Kristin

August 15, 2016, Rochester, NY: Lumetrics Inc., the leading manufacturer of precision measurement solution equipment known for offering precision thickness and wavefront measurement instrumentation, is proud to announce the launch of its highly anticipated Web Store. Lumetrics’ Web Store allows customers to easily order probes, fixtures, software, and other accessories in the U.S. (please note that web store shipments are limited to shipments to US State & territories). Lumetrics plans on adding international ordering to the Web Store in the future.

filed under: contact lenses, Lumetrics Inc., Non contact thickness measurement, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences, web store

Custom probe design used in-situ at plastic injection molding facility

Posted June 22, 2016 by Kristin

A customer approached Lumetrics with a desire to better understand the thickness profile during the molding process of manufacturing a plastic bottle. Due to cycling mechanical machinery within a 24-inch window around the pre-form, a standard probe (with standoff maximum of 2 inches) could not be used while the machine was running.

filed under: blow molding manufacturing, Lumetrics, Non contact thickness measurement, Optical Inspection, OptiGauge, packaging inspection, packaging thickness measurement

Precision Wedge Angle Measurement by Lumetrics Principal Scientist, Dr. Michael Marcus

Posted May 23, 2016 by Kristin

A customer approached Lumetrics with a need to determine  and certify the precision wedge angle measurement of low angle wedges in the range of 0.5 - 3.5° with a high degree of accuracy.   A custom fixture was designed and constructed which included x, y, z  and rotation stages with micrometer precision position feedback as shown in the diagram. 

filed under: Dimensional Measurement, glass thickness measurement, Lumetrics, Non-Contact Measurement, Thickness Measurement