The Lumenarium: The official blog of Lumetrics, Inc.

Kristin

Recent Posts

Lumetrics Granted New Patent: Toric Intraocular Lens Measurement Apparatus and Method

Posted January 26, 2017 by Kristin
This latest Lumetrics patent is for a device to physically rotate an intraocular lens inside the confined space afforded in a measurement cuvette.  There are times when rotating the data gathered using software is insufficient and the sample must physically be rotated.  This device maintains the alignment of  intraocular lens optical axis with that of the measurement device with which it is paired.  During the rotation the need for realignment is reduced or eliminated.  Read more about this new patent here.

filed under: Non-Contact Measurement

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Posted January 18, 2017 by Kristin

AbstractThe silicon wafer manufacturing process relies heavily on precision polished wafers that have uniform thickness and, depending on the application, also control parallelism to a secondary wafer after bonding.
Lumetrics’ low coherence interferometer, commercially marketed as OptiGauge II, is a device capable of measuring the simultaneous wafer thickness, adhesive thickness, and parallelism between surfaces to sub-micron precision. Combined with custom software and a precision XY raster scanner, a wafer or wafer assembly can be fully characterized with respect to layer thicknesses and surface parallelism.
Index Terms—adhesive, flatness, interferometry, metrology, optical thickness measurement, parallelism, silicon, wafer

filed under: Dimensional Measurement, Lumetrics, Non contact thickness measurement, optical thickness measurement, OptiGauge, OptiGauge II, Thickness Measurement

Lumetrics exhibiting at Photonics West 2017

Posted January 10, 2017 by Kristin

Photonics West 2017 is just around the corner and Lumetrics will be exhibiting in booth #616 from January 31st through February 2nd at the Moscone Center in San Francisco, CA. Lumetrics will be showcasing the OptiGauge® II as well as a live demonstration with the CLAS-IR adaptive optics, operating at telecom wavelengths.

filed under: Lumetrics, Non contact thickness measurement, Photonics

Data Relay Application by Clark Cianfarini

Posted October 04, 2016 by Kristin

How Lumetrics developed the Data Relay application to meet the needs of a customer who needed to use a non-windows based system.

filed under: Lumetrics, Thickness Measurement

Lumetrics, Inc. launches new Web Store for its Thickness and Wavefront Measurement Equipment

Posted August 16, 2016 by Kristin

August 15, 2016, Rochester, NY: Lumetrics Inc., the leading manufacturer of precision measurement solution equipment known for offering precision thickness and wavefront measurement instrumentation, is proud to announce the launch of its highly anticipated Web Store. Lumetrics’ Web Store allows customers to easily order probes, fixtures, software, and other accessories in the U.S. (please note that web store shipments are limited to shipments to US State & territories). Lumetrics plans on adding international ordering to the Web Store in the future.

filed under: contact lenses, Lumetrics Inc., Non contact thickness measurement, Thickness Measurement, Wavefront Measurement Articles, WaveFront Sciences, web store

Custom probe design used in-situ at plastic injection molding facility

Posted June 22, 2016 by Kristin

A customer approached Lumetrics with a desire to better understand the thickness profile during the molding process of manufacturing a plastic bottle. Due to cycling mechanical machinery within a 24-inch window around the pre-form, a standard probe (with standoff maximum of 2 inches) could not be used while the machine was running.

filed under: blow molding manufacturing, Lumetrics, Non contact thickness measurement, Optical Inspection, OptiGauge, packaging inspection, packaging thickness measurement

Precision Wedge Angle Measurement by Lumetrics Principal Scientist, Dr. Michael Marcus

Posted May 23, 2016 by Kristin

A customer approached Lumetrics with a need to determine  and certify the precision wedge angle measurement of low angle wedges in the range of 0.5 - 3.5° with a high degree of accuracy.   A custom fixture was designed and constructed which included x, y, z  and rotation stages with micrometer precision position feedback as shown in the diagram. 

filed under: Dimensional Measurement, glass thickness measurement, Lumetrics, Non-Contact Measurement, Thickness Measurement

ClearWave Plus: A brand new contact lens measurement solution

Posted April 20, 2016 by Kristin
The ClearWave™ Plus uses a modified ClearWave in combination with the industry standard OptiGauge®

filed under: center thickness, contact lens, contact lens measurement system, Dimensional Measurement, Non contact thickness measurement, Opthalmic, sagittal height, Wavefront Measurement Articles

Custom Precision Probe with Built-In Reference

Posted March 29, 2016 by Kristin

The successful implementation of non-contact thickness measurement and precision measurement solutions for our customers is heavily dependant on our team of hard-working and talented Engineers.  The following application summary is from one of our Opto-Mechanical engineers after working with a customer to design a custom solution for their critical measurement challenges.

filed under: custom metrology solutions, Lumetrics Inc., manufacturing, Non contact thickness measurement, Optical Interferometry, Optical Measurement, precision measurement, thickness measurement applications

Successful applications: Custom automated test system

Posted March 15, 2016 by Kristin

A customer needed a custom automated test system to reduce the inspection time during the setup of their production mold tools. At the time they were using a semi-automated system that would take 10-15 minutes to measure all 10 cavities of the mold tool. Lumetrics was asked to reduce the measurement time to 10 seconds or less with the use of our OptiGauge technology as well as add some addition measurement and functional capabilities.

filed under: Lumetrics, Non contact thickness measurement, Opthalmics, OptiGauge, Thickness Measurement